APA Zitierstil

Sauter, N. K. (2015). XFEL diffraction: Developing processing methods to optimize data quality. Journal of synchrotron radiation, 22(2), 239. https://doi.org/10.1107/S1600577514028203

Chicago Zitierstil

Sauter, Nicholas K. "XFEL Diffraction: Developing Processing Methods to Optimize Data Quality." Journal of Synchrotron Radiation 22, no. 2 (2015): 239. https://dx.doi.org/10.1107/S1600577514028203.

MLA Zitierstil

Sauter, Nicholas K. "XFEL Diffraction: Developing Processing Methods to Optimize Data Quality." Journal of Synchrotron Radiation, vol. 22, no. 2, 2015, p. 239.