Vanstreels, K., Wu, C., Gonzalez, M., Schneider, D., Gidley, D., Verdonck, P., & Baklanov, M. R. (2013). Effect of pore structure of nanometer scale porous films on the measured elastic modulus. Langmuir : the ACS journal of surfaces and colloids, 29(38), 12025. https://doi.org/10.1021/la402383g
Chicago ZitierstilVanstreels, Kris, Chen Wu, Mario Gonzalez, Dieter Schneider, David Gidley, Patrick Verdonck, und Mikhail R. Baklanov. "Effect of Pore Structure of Nanometer Scale Porous Films on the Measured Elastic Modulus." Langmuir : The ACS Journal of Surfaces and Colloids 29, no. 38 (2013): 12025. https://dx.doi.org/10.1021/la402383g.
MLA ZitierstilVanstreels, Kris, et al. "Effect of Pore Structure of Nanometer Scale Porous Films on the Measured Elastic Modulus." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 29, no. 38, 2013, p. 12025.