APA Zitierstil

Huijben, M., Yu, P., Martin, L. W., Molegraaf, H. J. A., Chu, Y., Holcomb, M. B., . . . Ramesh, R. (2013). Ultrathin limit of exchange bias coupling at oxide multiferroic/ferromagnetic interfaces. Advanced materials (Deerfield Beach, Fla.), 25(34), 4739. https://doi.org/10.1002/adma.201300940

Chicago Zitierstil

Huijben, M., P. Yu, L W. Martin, H J A. Molegraaf, Y-H Chu, M B. Holcomb, N. Balke, G. Rijnders, und R. Ramesh. "Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/ferromagnetic Interfaces." Advanced Materials (Deerfield Beach, Fla.) 25, no. 34 (2013): 4739. https://dx.doi.org/10.1002/adma.201300940.

MLA Zitierstil

Huijben, M., et al. "Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/ferromagnetic Interfaces." Advanced Materials (Deerfield Beach, Fla.), vol. 25, no. 34, 2013, p. 4739.