Kim, J. J., Cho, B., Kim, K. S., Lee, T., & Jung, G. Y. (2011). Electrical characterization of unipolar organic resistive memory devices scaled down by a direct metal-transfer method. Advanced materials (Deerfield Beach, Fla.), 23(18), 2104. https://doi.org/10.1002/adma.201100081
Style de citation ChicagoKim, Jin Ju, Byungjin Cho, Ki Seok Kim, Takhee Lee, et Gun Young Jung. "Electrical Characterization of Unipolar Organic Resistive Memory Devices Scaled Down by a Direct Metal-transfer Method." Advanced Materials (Deerfield Beach, Fla.) 23, no. 18 (2011): 2104. https://dx.doi.org/10.1002/adma.201100081.
Style de citation MLAKim, Jin Ju, et al. "Electrical Characterization of Unipolar Organic Resistive Memory Devices Scaled Down by a Direct Metal-transfer Method." Advanced Materials (Deerfield Beach, Fla.), vol. 23, no. 18, 2011, p. 2104.