APA Zitierstil

Alaboson, J. M. P., Wang, Q. H., Kellar, J. A., Park, J., Elam, J. W., Pellin, M. J., & Hersam, M. C. (2011). Conductive atomic force microscope nanopatterning of epitaxial graphene on SiC(0001) in ambient conditions. Advanced materials (Deerfield Beach, Fla.), 23(19), 2181. https://doi.org/10.1002/adma.201100367

Chicago Zitierstil

Alaboson, Justice M P., Qing Hua Wang, Joshua A. Kellar, Joohee Park, Jeffrey W. Elam, Michael J. Pellin, und Mark C. Hersam. "Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions." Advanced Materials (Deerfield Beach, Fla.) 23, no. 19 (2011): 2181. https://dx.doi.org/10.1002/adma.201100367.

MLA Zitierstil

Alaboson, Justice M P., et al. "Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions." Advanced Materials (Deerfield Beach, Fla.), vol. 23, no. 19, 2011, p. 2181.