Luria, J. L., Schwarz, K. A., Jaquith, M. J., Hennig, R. G., & Marohn, J. A. (2011). Spectroscopic characterization of charged defects in polycrystalline pentacene by time- and wavelength-resolved electric force microscopy. Advanced materials (Deerfield Beach, Fla.), 23(5), 624. https://doi.org/10.1002/adma.201003073
Style de citation ChicagoLuria, Justin L., Kathleen A. Schwarz, Michael J. Jaquith, Richard G. Hennig, et John A. Marohn. "Spectroscopic Characterization of Charged Defects in Polycrystalline Pentacene by Time- and Wavelength-resolved Electric Force Microscopy." Advanced Materials (Deerfield Beach, Fla.) 23, no. 5 (2011): 624. https://dx.doi.org/10.1002/adma.201003073.
Style de citation MLALuria, Justin L., et al. "Spectroscopic Characterization of Charged Defects in Polycrystalline Pentacene by Time- and Wavelength-resolved Electric Force Microscopy." Advanced Materials (Deerfield Beach, Fla.), vol. 23, no. 5, 2011, p. 624.