Cario, L., Vaju, C., Corraze, B., Guiot, V., & Janod, E. (2010). Electric-field-induced resistive switching in a family of mott insulators: Towards a new class of RRAM memories. Advanced materials (Deerfield Beach, Fla.), 22(45), 5193. https://doi.org/10.1002/adma.201002521
Style de citation ChicagoCario, Laurent, Cristian Vaju, Benoit Corraze, Vincent Guiot, et Etienne Janod. "Electric-field-induced Resistive Switching in a Family of Mott Insulators: Towards a New Class of RRAM Memories." Advanced Materials (Deerfield Beach, Fla.) 22, no. 45 (2010): 5193. https://dx.doi.org/10.1002/adma.201002521.
Style de citation MLACario, Laurent, et al. "Electric-field-induced Resistive Switching in a Family of Mott Insulators: Towards a New Class of RRAM Memories." Advanced Materials (Deerfield Beach, Fla.), vol. 22, no. 45, 2010, p. 5193.