Structural characterization of multi-quantum wells in electroabsorption-modulated lasers by using synchrotron radiation micrometer-beams

Structural characterization of multi-quantum wells in electroabsorption-modulated lasers by using synchrotron radiation micrometer-beams

Détails bibliographiques
Publié dans:Advanced materials (Deerfield Beach, Fla.). - 1998. - 22(2010), 18 vom: 11. Mai, Seite 2050-4
Auteur principal: Mino, Lorenzo (Auteur)
Autres auteurs: Gianolio, Diego, Agostini, Giovanni, Piovano, Andrea, Truccato, Marco, Agostino, Angelo, Cagliero, Stefano, Martinez-Criado, Gema, Codato, Simone, Lamberti, Carlo
Format: Article en ligne
Langue:English
Publié: 2010
Accès à la collection:Advanced materials (Deerfield Beach, Fla.)
Sujets:Journal Article Silicon Dioxide 7631-86-9
Description
Description:Date Completed 14.09.2010
Date Revised 30.09.2020
published: Print
Citation Status MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.200903407