APA Zitierstil

Vaswani, N., Rathi, Y., Yezzi, A., & Tannenbaum, A. (2010). Deform PF-MT: Particle filter with mode tracker for tracking nonaffine contour deformations. IEEE transactions on image processing : a publication of the IEEE Signal Processing Society, 19(4), 841. https://doi.org/10.1109/TIP.2009.2037465

Chicago Zitierstil

Vaswani, Namrata, Yogesh Rathi, Anthony Yezzi, und Allen Tannenbaum. "Deform PF-MT: Particle Filter with Mode Tracker for Tracking Nonaffine Contour Deformations." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society 19, no. 4 (2010): 841. https://dx.doi.org/10.1109/TIP.2009.2037465.

MLA Zitierstil

Vaswani, Namrata, et al. "Deform PF-MT: Particle Filter with Mode Tracker for Tracking Nonaffine Contour Deformations." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society, vol. 19, no. 4, 2010, p. 841.