Zhang, S., Sherlock, N. P., Meyer, R. J., & Shrout, T. R. (2009). Crystallographic dependence of loss in domain engineered relaxor-PT single crystals. Applied physics letters, 94(16), 162906.
Style de citation ChicagoZhang, Shujun, Nevin P. Sherlock, Richard J. Meyer, et Thomas R. Shrout. "Crystallographic Dependence of Loss in Domain Engineered Relaxor-PT Single Crystals." Applied Physics Letters 94, no. 16 (2009): 162906.
Style de citation MLAZhang, Shujun, et al. "Crystallographic Dependence of Loss in Domain Engineered Relaxor-PT Single Crystals." Applied Physics Letters, vol. 94, no. 16, 2009, p. 162906.
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