Effect of mechanical stress on the kinetics of heterogeneous electron transfer
The scanning electrochemical microscope (SECM) combined with a computerized tensile stage was employed to measure the kinetics of electron transfer (ET) reactions at stainless steel electrodes as a function of the applied mechanical stress. Reproducible current versus distance curves were obtained f...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 24(2008), 18 vom: 16. Sept., Seite 9941-4 |
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| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2008
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
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