Phase field modeling of domain structures in ferroelectric thin films

Phase-field simulations were used to explore the effect of the characteristics of the Landau-Devonshire free energy and values of electrostatic and elastic interactions on the formation of different types of domain structures in ferroelectric thin films. Simulations were performed at different const...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 55(2008), 5 vom: 01. Mai, Seite 963-70
1. Verfasser: Artemev, A (VerfasserIn)
Weitere Verfasser: Slutsker, J, Roytburd, A L
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2008
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. Membranes, Artificial
Beschreibung
Zusammenfassung:Phase-field simulations were used to explore the effect of the characteristics of the Landau-Devonshire free energy and values of electrostatic and elastic interactions on the formation of different types of domain structures in ferroelectric thin films. Simulations were performed at different constant-applied electric fields and by using a cyclic continuously changing field. It is shown that the 180 degrees or 90 degrees domain structures can be produced depending on the relative strength of elastic interactions and the ratio of barrier heights that determine the energy of the 180 degrees and 90 degrees domain boundaries. It is shown that the applied field strength and the thickness of the dead layer can play a minor role in the transition between the 90 degrees and 180 degrees domain structures. It is also demonstrated that the poling history can affect the type of the domain structure
Beschreibung:Date Completed 08.07.2008
Date Revised 19.11.2015
published: Print
Citation Status MEDLINE
ISSN:1525-8955
DOI:10.1109/TUFFC.2008.740