APA Zitierstil

Dague, E., Delcorte, A., Latgé, J., & Dufrêne, Y. F. (2008). Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis. Langmuir : the ACS journal of surfaces and colloids, 24(7), 2955. https://doi.org/10.1021/la703741y

Chicago Zitierstil

Dague, Etienne, Arnaud Delcorte, Jean-Paul Latgé, und Yves F. Dufrêne. "Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis." Langmuir : The ACS Journal of Surfaces and Colloids 24, no. 7 (2008): 2955. https://dx.doi.org/10.1021/la703741y.

MLA Zitierstil

Dague, Etienne, et al. "Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 24, no. 7, 2008, p. 2955.