Effects of contact geometry on pull-off force measurements with a colloidal probe
This paper examines the effects of contact geometry on the pull-off (adhesion) force between a glass sphere (colloidal probe) and a silicon wafer in an environment with controlled relative humidity. An atomic force microscope is used to measure the pull-off force between the colloidal probe and the...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 24(2008), 3 vom: 05. Feb., Seite 743-8 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2008
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
Volltext |