Magnetization profile of ultrathin FePd films

The method of circular dichroism in X-ray resonant magnetic scattering is presented which allows a straightforward determination of the magnetization profile of magnetic patterns in ultrathin films. Application to single crystalline FePd layers shows unambiguously the presence of magnetic flux closu...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 7(2000), Pt 3 vom: 01. Mai, Seite 178-81
Auteur principal: Dürr, H A (Auteur)
Autres auteurs: Dudzik, E, Dhesi, S S, Goedkoop, J B, van der Laan, G, Belakhovsky, M, Mocuta, C, Marty, A, Samson, Y
Format: Article
Langue:English
Publié: 2000
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article
Description
Résumé:The method of circular dichroism in X-ray resonant magnetic scattering is presented which allows a straightforward determination of the magnetization profile of magnetic patterns in ultrathin films. Application to single crystalline FePd layers shows unambiguously the presence of magnetic flux closure domains whose thickness can constitute a significant fraction ( approximately 25%) of the total film
Description:Date Completed 16.05.2006
Date Revised 12.04.2006
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775