APA Zitierstil

Sun, Y., Frenkel, A. I., Isseroff, R., Shonbrun, C., Forman, M., Shin, K., . . . Sokolov, J. C. (2006). Characterization of palladium nanoparticles by using X-ray reflectivity, EXAFS, and electron microscopy. Langmuir : the ACS journal of surfaces and colloids, 22(2), 807.

Chicago Zitierstil

Sun, Yuan, et al. "Characterization of Palladium Nanoparticles by Using X-ray Reflectivity, EXAFS, and Electron Microscopy." Langmuir : The ACS Journal of Surfaces and Colloids 22, no. 2 (2006): 807.

MLA Zitierstil

Sun, Yuan, et al. "Characterization of Palladium Nanoparticles by Using X-ray Reflectivity, EXAFS, and Electron Microscopy." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 22, no. 2, 2006, p. 807.