X-ray beam-position monitoring in the sub-micrometre and sub-second regime
It is demonstrated that X-ray beam positions can be extracted from two-dimensional profiles with sub-pixel resolution. Beam-position measurements utilizing a self-designed low-cost two-dimensional detector have been performed at two synchrotron radiation beamlines of the Swiss Light Source. The effe...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 12(2005), Pt 6 vom: 22. Nov., Seite 795-9 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |