A solution to the charging problems in capacitive micromachined ultrasonic transducers

We report on a capacitive micromachined ultrasonic transducer (CMUT) featuring isolation posts (PostCMUT) as a solution to the charging problems caused by device fabrication and operation. This design improves the device reliability. The PostCMUTs were fabricated using a newly developed process base...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 52(2005), 4 vom: 30. Apr., Seite 578-80
1. Verfasser: Huang, Yongli (VerfasserIn)
Weitere Verfasser: Haeggström, Edward O, Zhuang, Xuefeng, Ergun, Arif S, Khuri-Yakub, Butrus T
Format: Aufsatz
Sprache:English
Veröffentlicht: 2005
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Letter
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520 |a We report on a capacitive micromachined ultrasonic transducer (CMUT) featuring isolation posts (PostCMUT) as a solution to the charging problems caused by device fabrication and operation. This design improves the device reliability. The PostCMUTs were fabricated using a newly developed process based on the wafer-bonding technique. Paired tests showed the superior reliability characteristics of the PostCMUT design compared to those of conventional CMUT designs. No deleterious effect of the new design was seen in preliminary ultrasonic tests or in process yield. PostCMUTs, a design that serves as a solution to the aforementioned reliability problem, constitutes a major contribution to CMUT commercialization 
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700 1 |a Zhuang, Xuefeng  |e verfasserin  |4 aut 
700 1 |a Ergun, Arif S  |e verfasserin  |4 aut 
700 1 |a Khuri-Yakub, Butrus T  |e verfasserin  |4 aut 
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