Determination of the orthotropic elastic constants of thin PET film by an ultrasonic micro-spectrometer

von Okabe, Y
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (1999)

P(VDF-TrFE) transducer with a concave annular structure for the measurement of layer thickness

von Saito, M
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (1993)

Angular spectral approach to reflection of focused beams with oblique incidence in spherical-planar-pair lenses

von Tsukahara, Y
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (1991)

An acoustic micrometer and its application to layer thickness measurements

von Tsukahara, Y
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (1989)

Excitation of plate waves in thickness measurements of layers deposited on thin plates

von Tsukahara, Y
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (1989)