Surface mapping of field-induced piezoelectric strain at elevated temperature employing full-field interferometry

von Stevenson, Tim
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (2015)

Piezoelectric thin films evaluation of electrical and electromechanical characteristics for MEMS devices

von Prume, Klaus
Veröffentlicht in: IEEE transactions on ultrasonics, ferroelectrics, and frequency control (2007)