Automatic bad-pixel mask maker for X-ray pixel detectors with application to serial crystallography

par Sadri, Alireza
Publié dans: Journal of applied crystallography (2022)

Data reduction for serial crystallography using a robust peak finder

par Hadian-Jazi, Marjan
Publié dans: Journal of applied crystallography (2021)

Effective Sampling Fast Segmentation Using Robust Geometric Model Fitting

par Tennakoon, Ruwan
Publié dans: IEEE transactions on image processing : a publication of the IEEE Signal Processing Society (2018)

Clustering with Hypergraphs The Case for Large Hyperedges

par Purkait, Pulak
Publié dans: IEEE transactions on pattern analysis and machine intelligence (2017)