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$Depth-Resolved Characterization of Perylenediimide Side-Chain Polymer Thin Film Structure Using Grazing-Incidence Wide-Angle X-ray Diffraction with Tender X-rays$

Depth-Resolved Characterization of Perylenediimide Side-Chain Polymer Thin Film Structure Using Grazing-Incidence Wide-Angle X-ray Diffraction with Tender X-rays

von Kamitani, Kazutaka
Veröffentlicht in: Langmuir : the ACS journal of surfaces and colloids (2018)
Weitere Verfasser: “...Hamada, Ayumi...”

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